100 mK prober

The 100 mK prober extends the capabilities of our 1 K prober and enables device testing below 100 mK. At sub-100 mK temperatures, the available cooling power is insufficient to compensate for the heat dissipation of the positioning stage. To address this, we implement a unique thermal management concept (patent pending).

A thermal isolator is introduced between the positioning stage and the sample, allowing motion to be transmitted while thermally decoupling the positioning stage from the sample. This enables the piezo positioners to be thermally anchored at a higher temperature stage, where more cooling power is available, while the sample holder remains anchored to the cryostat cold plate.

Sample temperatures of 75 mK are achieved with re-thermalization times of less than one minute after moving from one device to the next.

The 100 mK prober offers the same probing capabilities as the 1 K prober, including probing area, probe card compatibility, and optical access.